Readout Techniques

Wedge-and-Strip Anode (2-dimensional)

For high resolution and linearity at low count rates
Usage in strong magnetic fields
Very compact design
Image charge coupling for sealed detector systems

Delay-Line Anode (2-dimensional)

For high counts rates (1MHz)
Multi-hit capable (10ns)
Large area detectors possible

Detector WSD 40 with Wedge-and-Strip Anode

Detector WSD 40 with Wedge-and-Strip Anode (Ø 65mm ´ 8mm)

Resistive Anode (1-dimensional)
For standard tasks
Simple readout electronics

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Delay-Line detector DLD 40 with high voltage power supply and differential-amplifier-constant-fraction unit.

Delay-Line Anode (1-dimensional)
For highest counts rates (10MHz)
Multi-hit capable (10ns)
For spectrometer readout

All Detectors use a matched stack of Microchannel-Plates (Galileo Long Life™ or Philips Imaging Quality) mounted with a pair of ceramic rings (metal coated contacts for easy soldering or clamping).

 

Electronics


For Delay-line anode readout

Differential amplifier with integrated constant fraction discriminator (multihit pulse pair resolution 10ns)
Standalone time-to-digital converter (TDC) 20kHz, PC-based
Standalone histogram-TDC HM1 1MHz, PC-based

For Wedge-and-Strip and Resistive anode readout

Charge sensitive amplifiers
Analog-to-digital-converter (ADC)
Protective high-voltage supply for MCP-detectors

 

The HM1: a TDC with Histogram Memory for 1MHz Acquisition Rate

TDC Module

HM1: standalone PC-based 4-channel TDC with 32MB Histogram memory for fast readout of Delay-Line-Detectors.

 

 

 

 

Oscilloscope image using the anolog output of the HM1 for detector adjustment

Fast Position- and Time-Sensitive MCP-Detectors

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12595 Ruette Alliante #148
San Diego, CA 92130
v/fax: (509) 752-0123
mcp@sciner.com
http://www.sciner.com/MCP/
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