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Right-angle UV grade fused silica prisms

These prisms are 45-45-90 degree prisms, which are used to direct beams at 90 degrees. Very high prism transmission achieved by using the hypotenuse face in total internal reflection (TIR). The right angle prisms are often preferable to an inclined mirror in applications involving severe acoustic or inertial loads because they combine the mounting and acoustic isolation advantages of a prism with the excellent transmission of UV grade synthetic fused silica. They are easier to mount, and deform much less than mirror in response to external mechanical stress.

Various antireflection coating are available for the entrance and exit faces.

All right-angle prisms listed have entrance and exit faces of identical size and shape. Triangular faces are fine ground, and edges are slightly beveled.

General Specifications:

  Dimensions    ± 0.2mm
  Flatness    l/4 at 633nm over central 90% of edge dimension
  Surface Quality    60-40 scratch and dig
  Material    UV grade synthetic fused silica

Standard Dimensions:

Size of Face, mm*mm

90° angle tolerance

Pyramidal tolerance

Cat.- No.

10.0*10.0

± 2 arcmin

± 1 arcmin

19801

15.0*15.0

19803

20.0*20.0

19805

25.0*25.0

19807

30.0*30.0

19808

10.0*10.0

± 30 arcsec

± 30 arcsec

19821

12.0*12.0

19822

15.0*15.0

19823

20.0*20.0*15.0

19825

20.0*20.0*20.0

19826

25.0*25.0

19827

30.0*30.0

19829

50.0*50.0

19831

10.0*10.0

± 5 arcsec

± 5 arcsec

19809

15.0*15.0

19811

20.0*20.0

19813

25.0*25.0

19815

30.0*30.0

19817

50.0*50.0

19819

Prisms available in online store:

UV grade fused silica:

Model+   Product Name   Price   Buy Now 
 DSP-FS-20   Dispersion prism, UV FS, 20x20x20 mm   $100.00  Buy Now 
 DVP-FS-10   Dove prism, UV FS, 10x10x40 mm   $80.00  Buy Now 
 DVP-FS-20   Dove prism, UV FS, 20x20x82 mm   $100.00  Buy Now 
 RAP-FS-10   Right angle prism, UV FS, 10x10x10 mm   $80.00  Buy Now 
 RAP-FS-12   Right angle prism, UV FS, 12x12x12 mm   $90.00  Buy Now 
 RAP-FS-15   Right angle prism, UV FS, 15x15x15 mm   $90.00  Buy Now 
 RAP-FS-20   Right angle prism, UV FS, 20x20x20 mm   $90.00  Buy Now 
 RAP-FS-30   Right angle prism, UV FS, 30x30x30 mm   $135.00  Buy Now 
 RAP-FS-5   Right angle prism, UV FS,  5x5x5 mm   $60.00  Buy Now 
 RAP-FS-50   Right angle prism, UV FS, 50x50x50 mm   $135.00  Buy Now 
 RRF-FS-1   Retro-Reflector, UV FS, ø 25.4 mm   $190.00  Buy Now 

BK-7 glass

 Model   Product Name+   Price   Buy Now 
 DSP-BK7-20   Dispersion prism, BK-7, 20x20x20 mm   $80.00  Buy Now 
 DVP-BK7-10   Dove prism, BK-7, 10x10x40 mm   $75.00  Buy Now 
 RAP-BK7-20   Right angle prism, BK-7, 20x20x20 mm   $65.00  Buy Now 

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Rutile (TiO2) coupling prisms and their applications - buy online - download brochure

Del Mar Photonics offers optical elements made of high quality synthetically grown Rutile Titanium Dioxide crystals. Rutile’s strong birefringency, wide transmission range and good mechanical properties make it suitable for fabrication of polarizing cubes, prisms and optical isolators. Boules having high optical transmission and homogeneity are grown by proprietary method. Typical boules have 10 - 15 mm in dia. and up to 25 mm length. Optical elements sizes - from 2 x 2 x 1 mm to 12.7 x 12.7 x 12.7 mm. Laser grade polish quality is available for finished elements. So far we the largest elements that we manufactured are 12 x15 x 5 mm, in which optical axis is parallel to 15 mm edge, 5 mm is along beam path, 12 x 15 mm faces polished 20/10 S/D, one wave flatness, parallelism < 3 arc.min. (better specs. available on request).
 

Standard Specifications (buy online):

Rutile (TiO2) coupling prism
Material: single crystal TiO2
Sizes: 5x5x5 mm +/- 0.2 mm
Angles:45-45-90 deg.+/-10 arcmin
Polish quality: 20/10Scratch/Dig
Surface flatness: lambda @ 633nm
Parallelism: <5arcmins
Orientation: Z-axis along prism thickness +/- 15 arcmin

Research description for a Rutile coupling prism

This description will give a brief insight into our research at the Light Technology Institute of the University of Karlsruhe (TH), Germany. One of our research fields is the development of electrically pumped organic semiconductor thin film lasers. Due to the complex behavior of these lasers numerous electrical and optical characterization is necessary. One of the most important optical properties of these organic semiconductor laser structures is the attenuation coefficient of the multilayer waveguide, which has to be carefully optimized to reduce waveguide losses 1. The first step in the optimization process is the numerical simulation of the anticipated waveguide design. Next, the optimized sample structure is fabricated and characterized in our attenuation measurement setup. This measurement is done as follows:
A Rutile coupling prism is pressed onto the waveguide. A laser beam is then coupled into the prism so that total reflection occurs inside the prism at the interface to the waveguide. In the vicinity of the waveguide the overlapping incident and reflected beam generate a standing wave. The evanescent field of that standing wave penetrates into the waveguide.





Evanescent field coupling



Under a certain angle and if the phase match conditions are fulfilled, the evanescent field stimulates a mode that is guided by the waveguide. The phase match condition can only be achieved when the refractive index of the prism is at least as high as the effective refractive index of the waveguide. Owing to its high refractive index, Rutile is an ideal material for use as a coupling prism in such a prism-coupler waveguide attenuation measurement setup.
 


Beam coupling into waveguide



A small fraction of the guided light is scattered out of the waveguide. The intensity of this scattered light is assumed to be proportional to the intensity of the guided light. Thus the intensity distribution inside the waveguide along the propagation direction can be directly determined through measuring the intensity of the scattered light.




Streak caused by scattering inside the waveguide



The intensity distribution is detected with a computer controlled, cooled CCD-Camera. Finally the attenuation coefficient is extracted from the measured data.




Intensity distribution measured with CCD-Camera




The following two figures show the setup that was used for the measurements.
 




Schematic of the Setup
 



Photography of the Setup



Additionally, it is possible with our setup to measure the refractive index and the thickness of waveguides that support a minimum of two guided modes. These parameters can be extracted from the dependency between coupling angle and effective refractive index.

Keywords: Prism, Coupling, Thin film waveguide, Waveguide losses, scattering, Effective refractive index, Organic semiconductor lasers, Polymer, Small molecule, Evanescent field, CCD-Camera, Coupling angle

1 M. Reufer, J. Feldmann, P. Rudati, A. Ruhl, D. Müller, K. Meerholz, C. Karnutsch, M. Gerken, and U. Lemmer, Appl. Phys. Lett. 86, 221102 (2005).
 

MSc.Christian Karnutsch
Lichttechnisches Institut
Universität Karlsruhe (TH)
Geb. 30.34
Kaiserstraße 12
D-76131 Karlsruhe

Raum: 126
Telefon: +49 721 608 7742
Telefax: +49 (0)721 608 - 2590


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